Quadrature phase interferometer for high resolution force spectroscopy

Abstract : In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the cantilever tip and a reference beam reflecting on the static base of the sensor. A design with very low environmental susceptibility and another allowing calibrated measurements on a wide spectral range are described. Both enable a very high resolution (down to 2.5E-15 m/rtHz), illustrated by thermal noise measurements on AFM cantilevers. They present an excellent long-term stability, and a constant sensitivity independent of the optical phase of the interferometer. A quick review shows that our precision is equaling or out-performing the best results reported in the literature, but for a much larger deflection range, up to a few µm.
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Contributeur : Ludovic Bellon <>
Soumis le : jeudi 8 août 2013 - 11:08:56
Dernière modification le : jeudi 19 avril 2018 - 14:54:03
Document(s) archivé(s) le : samedi 9 novembre 2013 - 04:13:25


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Pierdomenico Paolino, Felipe Aguilar Sandoval, Ludovic Bellon. Quadrature phase interferometer for high resolution force spectroscopy. Review of Scientific Instruments, American Institute of Physics, 2013, 84, pp.095001. 〈http://scitation.aip.org/content/aip/journal/rsi/84/9/10.1063/1.4819743〉. 〈10.1063/1.4819743〉. 〈ensl-00830294v2〉



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