Chirality-Biased Point Defects Dynamics on a Disclination Line in a Nematic Liquid Crystal

Abstract : Chiral additives in the nematic liquid crystal can alter the dynamics of point defects moving on a disclination line. They exert a constant force on defects, leading to the bimodal distribution of distances between them at long times. The evolution of the system of defects in the presence of chiral additives provides a very direct proof of the existence of repulsive forces between the defects at large distances. We find that addition of a sufficient amount of chiral compound removes all point defects from the system. The process is studied in the system of 8CB (4-n-octyl-4 '-cyanobiphenyl) doped with the chiral compound S811 (from Merck Co.) and in the computer simulations.
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  • HAL Id : ensl-00181448, version 1
  • ARXIV : 0710.4390

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Andrzej Zywocinski, Katarzyna Pawlak, Robert Holyst, Patrick Oswald. Chirality-Biased Point Defects Dynamics on a Disclination Line in a Nematic Liquid Crystal. Journal of Physical Chemistry B, American Chemical Society, 2005, 109 (19), pp.9712-9718. ⟨ensl-00181448⟩

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